doc. dr. Christian Teichert

Academic CV

  • 1980-1985 Studied Physics at the Martin-Luther-University Halle-Wittenberg
  • 1984-1985 Diploma thesis at the Academy-Institute for Solid State Physics and Electron Microscopy in Halle Topic: "Angle of diffraction reflections profile analysis low energy electron "
  • 8/1992 PhD at the Martin-Luther-University Halle-Wittenberg, Topic: "Atomic processes at the silver (100) surface by ion bombardment during the removal and during the homoepitaxial growth"
  • 3/2001 Habilitation in "Materials Physics" at the University of Leoben, Austria Topic of the thesis: "Self-organization of Nanostructures in Semiconductor Heteroepitaxy "


  • 9/85 - 12/91 Research assistant at the Academy-Institute for Solid State Physics and Electron Microscopy in Halle
  • 1/92 - 8/92 Research Fellow at the Max Planck Institute of Microstructure Physics in Halle
  • 9/92 - 6/93 Fellow of the Humboldt-Stiftung at the Institute for Interface Research and Vacuum Physics at the Forschungszentrum Jülich with Professor G. Comsa and Dr. B. Poelsema
  • 9/93 - 8/95 Research stay with a postdoctoral fellowship from the German Academic Exchange Service, Department of Materials Science and Engineering, University of Wisconsin-Madison with Professor MG Lagally
  • 9/95 - 1/96 Research Associate, Department of Materials Science and Engineering, University of Wisconsin-Madison, USA
  • 3/96 - 8/96 Postdoctoral fellow of the Max Planck Society, Max Planck Institute of Microstructure Physics, Halle
  • 8/96 -12/97 Research Fellow at the Max Planck Institute of Microstructure Physics, Halle
  • 1/98 - 9/2001 Assistant at the Institute of Physics, Leoben University and Director of the Working Group Scanning Probe Microscopy 
  • Since 10/2001 Associate Professor of the subject "Material Physics" at the Institute of Physics, University of Leoben

Scholarships and Awards


  • 9/92 - 6/93: Fellowship of the Alfried Krupp von Bohlen and Halbach Foundation and the Alexander von Humboldt Foundation (Integration Program) 
  • 9/93 - 8/95: post-doctoral fellowship from the German Academic Exchange Service, 
  • 3/96 - 2/97: post-doctoral fellowship of the Max Planck Society 
  • 3/2002: Gaede-Prize 2002 of the German Vacuum Society 



In scanning probe microscopy group at the Institute of Physics, University of Leoben in Leoben, studies surface nanostructures and their physical properties using atomic force microscopy and related techniques. The focus is on self-organization inorganic semiconductor nanostructures and on the heteroepitaxy and ion bombardment, and the detection of molecular processes in the growth of organic semiconductor layers. Nanomagnet arrays are examined for self-organized semiconductor templates using magnetic force microscopy. The conductive AFM is used to study the electrical properties of dielectric and piezoelectric materials on the nanometer scale. Finally roughness analysis and contact angle measurements of steel and hard coatings on polymers are examined.